Home » System-On-Chip Test Architectures: Nanometer Design for Testability. Systems on Sillicon by Laung-Terng Wang
System-On-Chip Test Architectures: Nanometer Design for Testability. Systems on Sillicon Laung-Terng Wang

System-On-Chip Test Architectures: Nanometer Design for Testability. Systems on Sillicon

Laung-Terng Wang

Published January 1st 2008
ISBN : 9786611100049
ebook
896 pages
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 About the Book 

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increasedMoreModern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of todays overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs.